Mech-Eye SDK 2.3.0 released with enhanced reflection resistance for structured-light cameras and improved profile extraction for laser profilers

Mech-Eye SDK 2.3.0 officially released, providing the following highlight functions:

  • Enhanced resistance to reflection: A new structured-light pattern improves point cloud quality in scenarios with reflections from the object surface, inner walls of the bin, and more
  • Upgraded profile extraction algorithm: A new algorithm provides more diverse and accurate options for profile extraction
  • New encoder settings tool: Encoder-relevant values can be calculated with a few simple steps

Download latest Mech-Eye SDK here.

See details on point cloud improvement.